dc.contributor.author | Nærland, Tine Uberg | |
dc.contributor.author | Angelskår, Hallvard | |
dc.contributor.author | Marstein, Erik Stensrud | |
dc.date.accessioned | 2017-08-28T10:29:14Z | |
dc.date.available | 2017-08-28T10:29:14Z | |
dc.date.created | 2013-07-24T09:33:06Z | |
dc.date.issued | 2013 | |
dc.identifier.citation | Journal of Applied Physics. 2013, 113 (19), . | nb_NO |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | http://hdl.handle.net/11250/2452033 | |
dc.language.iso | eng | nb_NO |
dc.title | Direct monitoring of minority carrier density during light induced degradation in Czochralski silicon by photoluminescence imaging | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | acceptedVersion | nb_NO |
dc.rights.holder | © 2013 AIP Publishing LLC. | nb_NO |
dc.source.pagenumber | 7 | nb_NO |
dc.source.volume | 113 | nb_NO |
dc.source.journal | Journal of Applied Physics | nb_NO |
dc.source.issue | 19 | nb_NO |
dc.identifier.doi | 10.1063/1.4806999 | |
dc.identifier.cristin | 1040094 | |
dc.relation.project | Norges forskningsråd: 181884 | nb_NO |
cristin.unitcode | 7492,1,3,0 | |
cristin.unitname | Solenergi | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 2 | |