Direct monitoring of minority carrier density during light induced degradation in Czochralski silicon by photoluminescence imaging

Nærland, Tine Uberg; Angelskår, Hallvard; Marstein, Erik Stensrud
Journal article, Peer reviewed
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http://hdl.handle.net/11250/2452033
Date
2013
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Original version
Journal of Applied Physics. 2013, 113 (19), .   10.1063/1.4806999
Journal
Journal of Applied Physics
Copyright
© 2013 AIP Publishing LLC.