Investigation of the areas with high D07-band emission in multicrystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging
| dc.contributor.author | Thøgersen, Annett | |
| dc.contributor.author | Jensen, Ingvild Julie Thue | |
| dc.contributor.author | Mehl, Torbjørn | |
| dc.contributor.author | Burud, Ingunn | |
| dc.contributor.author | Olsen, Espen | |
| dc.contributor.author | Ringdalen, Inga Gudem | |
| dc.contributor.author | Zhu, Junjie | |
| dc.contributor.author | Søndenå, Rune | |
| dc.date.accessioned | 2024-05-28T10:45:25Z | |
| dc.date.available | 2024-05-28T10:45:25Z | |
| dc.date.created | 2024-04-25T13:34:22Z | |
| dc.date.issued | 2024 | |
| dc.identifier.citation | Journal of Applied Physics. 2024, 135 (13), . | en_US |
| dc.identifier.issn | 0021-8979 | |
| dc.identifier.uri | https://hdl.handle.net/11250/3131688 | |
| dc.language.iso | eng | en_US |
| dc.rights | Navngivelse 4.0 Internasjonal | * |
| dc.rights.uri | http://creativecommons.org/licenses/by/4.0/deed.no | * |
| dc.title | Investigation of the areas with high D07-band emission in multicrystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging | en_US |
| dc.title.alternative | Investigation of the areas with high D07-band emission in multicrystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging | en_US |
| dc.type | Peer reviewed | en_US |
| dc.type | Journal article | en_US |
| dc.description.version | publishedVersion | en_US |
| dc.rights.holder | © Author(s) 2024. | en_US |
| dc.source.pagenumber | 7 | en_US |
| dc.source.volume | 135 | en_US |
| dc.source.journal | Journal of Applied Physics | en_US |
| dc.source.issue | 13 | en_US |
| dc.identifier.doi | 10.1063/5.0196586 | |
| dc.identifier.cristin | 2264519 | |
| dc.relation.project | Norges forskningsråd: 280909 | en_US |
| dc.relation.project | Norges forskningsråd: 197405 | en_US |
| cristin.ispublished | true | |
| cristin.fulltext | original | |
| cristin.qualitycode | 1 |
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