Investigation of the areas with high D07-band emission in multicrystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging

Thøgersen, Annett; Jensen, Ingvild Julie Thue; Mehl, Torbjørn; Burud, Ingunn; Olsen, Espen; Ringdalen, Inga Gudem; Zhu, Junjie; Søndenå, Rune
Peer reviewed, Journal article
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https://hdl.handle.net/11250/3131688
Date
2024
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Original version
Journal of Applied Physics. 2024, 135 (13), .   10.1063/5.0196586
Journal
Journal of Applied Physics
Copyright
© Author(s) 2024.
Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal