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Is It Possible to Unambiguously Assess the Presence of Two Defects By Temperature- and Injection-Dependent Lifetime Spectroscopy?
Nærland, Tine Uberg
;
Bernardini, Simone
;
Wiig, Marie Syre
;
Bertoni, Mariana
Peer reviewed, Journal article
Accepted version
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ieee-j-photovoltaics2018-naerland.PDF (2.025Mb)
URI
http://hdl.handle.net/11250/2557802
Date
2018
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Original version
IEEE Journal of Photovoltaics. 2018, 8 (2), 465-472.
10.1109/JPHOTOV.2018.2794880
Journal
IEEE Journal of Photovoltaics
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