Vis enkel innførsel

Is It Possible to Unambiguously Assess the Presence of Two Defects By Temperature- and Injection-Dependent Lifetime Spectroscopy?

dc.contributor.authorNærland, Tine Uberg
dc.contributor.authorBernardini, Simone
dc.contributor.authorWiig, Marie Syre
dc.contributor.authorBertoni, Mariana
dc.date.accessioned2018-08-14T07:37:24Z
dc.date.available2018-08-14T07:37:24Z
dc.date.created2018-02-22T10:15:51Z
dc.date.issued2018
dc.identifier.citationIEEE Journal of Photovoltaics. 2018, 8 (2), 465-472.
dc.identifier.issn2156-3381
dc.identifier.urihttp://hdl.handle.net/11250/2557802
dc.language.isoeng
dc.titleIs It Possible to Unambiguously Assess the Presence of Two Defects By Temperature- and Injection-Dependent Lifetime Spectroscopy?
dc.title.alternativeIs It Possible to Unambiguously Assess the Presence of Two Defects By Temperature- and Injection-Dependent Lifetime Spectroscopy?
dc.typePeer reviewed
dc.typeJournal article
dc.description.versionacceptedVersion
dc.source.pagenumber465-472
dc.source.volume8
dc.source.journalIEEE Journal of Photovoltaics
dc.source.issue2
dc.identifier.doi10.1109/JPHOTOV.2018.2794880
dc.identifier.cristin1567781
dc.relation.projectNorges forskningsråd: 193829
cristin.unitcode7492,1,3,0
cristin.unitnameSolenergi
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


Tilhørende fil(er)

Thumbnail
Filnavn:
ieee-j-photovoltaics2018-naerl ...
Størrelse:
2.025Mb
Format:
Ukjent
Åpne

Denne innførselen finnes i følgende samling(er)

Vis enkel innførsel