Modulating the field-effect passivation at the SiO2/c-Si interface: Analysis and verification of the photoluminescence imaging under applied bias method

Haug, Halvard; Olibet, Sara; Nordseth, Ørnulf; Marstein, Erik Stensrud
Journal article, Peer reviewed
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http://hdl.handle.net/11250/2451841
Date
2013
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Original version
Journal of Applied Physics. 2013, 114 (17), .   10.1063/1.4827417
Journal
Journal of Applied Physics
Copyright
© 2013 AIP Publishing LLC.