Investigation of veryintenseD3-band emission in multi-crystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging

Thøgersen, Annett; Jensen, Ingvild Julie Thue; Graff, Joachim Seland; Ringdalen, Inga Gudem; Almeida Carvalho, Patricia; Mehl, Torbjørn; Zhu, Junjie; Burud, Ingunn; Olsen, Espen; Søndenå, Rune
Peer reviewed, Journal article
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URI
https://hdl.handle.net/11250/2999270
Date
2022
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Original version
https://doi.org/10.1063/5.0087119
Journal
Journal of Applied Physics
Copyright
© 2022 Author(s).
Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal