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Broadband angular color stability of dielectric thin film-coated pyramidal textured Si for photovoltaics

dc.contributor.authorRoosloot, Nathan
dc.contributor.authorNeder, Verena
dc.contributor.authorHaug, Halvard
dc.contributor.authorYou, Chang Chuan
dc.contributor.authorPolman, A.
dc.contributor.authorMarstein, Erik Stensrud
dc.date.accessioned2021-09-17T08:05:31Z
dc.date.available2021-09-17T08:05:31Z
dc.date.created2021-05-25T13:38:19Z
dc.date.issued2021
dc.identifier.citationJournal of Applied Physics. 2021, 129 .en_US
dc.identifier.issn0021-8979
dc.identifier.urihttps://hdl.handle.net/11250/2778815
dc.description© 2021 Author(s). Published under an exclusive license by AIP Publishing.en_US
dc.language.isoengen_US
dc.titleBroadband angular color stability of dielectric thin film-coated pyramidal textured Si for photovoltaicsen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.source.pagenumber9en_US
dc.source.volume129en_US
dc.source.journalJournal of Applied Physicsen_US
dc.identifier.doi10.1063/5.0048102
dc.identifier.cristin1911716
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.fulltextpostprint
cristin.qualitycode1


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