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dc.contributor.authorGuzik, Matylda N.
dc.contributor.authorSchrade, Matthias
dc.contributor.authorTofan, Raluca
dc.contributor.authorAlmeida Carvalho, Patricia
dc.contributor.authorBerland, Kristian
dc.contributor.authorSørby, Magnus Helgerud
dc.contributor.authorPersson, Clas
dc.contributor.authorGunnæs, Anette Eleonora
dc.contributor.authorHauback, Bjørn
dc.date.accessioned2019-06-26T07:02:45Z
dc.date.available2019-06-26T07:02:45Z
dc.date.created2019-05-05T20:23:14Z
dc.date.issued2019
dc.identifier.citationCrysteEngComm. 2019, 21 3330-3342.nb_NO
dc.identifier.issn1466-8033
dc.identifier.urihttp://hdl.handle.net/11250/2602209
dc.language.isoengnb_NO
dc.titleLong- and short-range structures of Ti1-xHfxNi1.0/1.1Sn half-Heusler compounds and their electric transport propertiesnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber3330-3342nb_NO
dc.source.volume21nb_NO
dc.source.journalCrysteEngCommnb_NO
dc.identifier.doi10.1039/C9CE00046A
dc.identifier.cristin1695652
dc.relation.projectNotur/NorStore: NN9180Knb_NO
dc.relation.projectNorges forskningsråd: 228854nb_NO
cristin.unitcode7492,1,7,0
cristin.unitnameNøytron materialkarakterisering
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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