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dc.contributor.authorSøndenå, Rune
dc.contributor.authorWiig, Marie Syre
dc.date.accessioned2019-03-19T14:02:32Z
dc.date.available2019-03-19T14:02:32Z
dc.date.created2019-03-14T09:32:56Z
dc.date.issued2019
dc.identifier.issn0021-8979
dc.identifier.urihttp://hdl.handle.net/11250/2590682
dc.language.isoengnb_NO
dc.titleEvolution of the light sensitive defects in high performance multicrystalline silicon wafersnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.volume125nb_NO
dc.source.journalJournal of Applied Physicsnb_NO
dc.source.issue8nb_NO
dc.identifier.doi10.1063/1.5079496
dc.identifier.cristin1684660
dc.relation.projectNorges forskningsråd: 257639nb_NO
dc.relation.projectNorges forskningsråd: 268027nb_NO
cristin.unitcode7492,1,3,0
cristin.unitnameSolenergi
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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