Evolution of the light sensitive defects in high performance multicrystalline silicon wafers
dc.contributor.author | Søndenå, Rune | |
dc.contributor.author | Wiig, Marie Syre | |
dc.date.accessioned | 2019-03-19T14:02:32Z | |
dc.date.available | 2019-03-19T14:02:32Z | |
dc.date.created | 2019-03-14T09:32:56Z | |
dc.date.issued | 2019 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | http://hdl.handle.net/11250/2590682 | |
dc.language.iso | eng | nb_NO |
dc.title | Evolution of the light sensitive defects in high performance multicrystalline silicon wafers | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | acceptedVersion | nb_NO |
dc.source.volume | 125 | nb_NO |
dc.source.journal | Journal of Applied Physics | nb_NO |
dc.source.issue | 8 | nb_NO |
dc.identifier.doi | 10.1063/1.5079496 | |
dc.identifier.cristin | 1684660 | |
dc.relation.project | Norges forskningsråd: 257639 | nb_NO |
dc.relation.project | Norges forskningsråd: 268027 | nb_NO |
cristin.unitcode | 7492,1,3,0 | |
cristin.unitname | Solenergi | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 1 |