Minority carrier lifetimes in Cz-Si wafers with intentional V-I transitions
dc.contributor.author | Søndenå, Rune | |
dc.contributor.author | Ryningen, Birgit | |
dc.contributor.author | Juel, Mari | |
dc.date.accessioned | 2018-01-08T12:02:10Z | |
dc.date.available | 2018-01-08T12:02:10Z | |
dc.date.created | 2017-12-08T10:29:24Z | |
dc.date.issued | 2017 | |
dc.identifier.citation | Energy Procedia. 2017, 124 ?-786. | nb_NO |
dc.identifier.issn | 1876-6102 | |
dc.identifier.uri | http://hdl.handle.net/11250/2476197 | |
dc.language.iso | eng | nb_NO |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/deed.no | * |
dc.title | Minority carrier lifetimes in Cz-Si wafers with intentional V-I transitions | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | publishedVersion | nb_NO |
dc.rights.holder | © 2017 The Author(s). Published by Elsevier Ltd. | nb_NO |
dc.source.volume | 124 | nb_NO |
dc.source.journal | Energy Procedia | nb_NO |
dc.identifier.doi | 10.1016/j.egypro.2017.09.348 | |
dc.identifier.cristin | 1524559 | |
cristin.unitcode | 7492,1,3,0 | |
cristin.unitname | Solenergi | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 |