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Investigation of Depth of Laser Damage to Silicon as Function of Wavelength and Pulse Duration

dc.contributor.authorThorstensen, Jostein Bruun
dc.contributor.authorFoss, Sean Erik
dc.date.accessioned2017-08-28T07:55:58Z
dc.date.available2017-08-28T07:55:58Z
dc.date.created2013-11-28T17:25:54Z
dc.date.issued2013
dc.identifier.citationEnergy Procedia. 2013, 38 794-800.nb_NO
dc.identifier.issn1876-6102
dc.identifier.urihttp://hdl.handle.net/11250/2451976
dc.language.isoengnb_NO
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleInvestigation of Depth of Laser Damage to Silicon as Function of Wavelength and Pulse Durationnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.rights.holderCopyright © 2013 The Authors. Published by Elsevier Ltd.nb_NO
dc.source.pagenumber794-800nb_NO
dc.source.volume38nb_NO
dc.source.journalEnergy Procedianb_NO
dc.identifier.doi10.1016/j.egypro.2013.07.348
dc.identifier.cristin1070636
dc.relation.projectNorges forskningsråd: 181884nb_NO
cristin.unitcode7492,1,3,0
cristin.unitnameSolenergi
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal