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First-principles study on electronic structure, phase stability, and optical properties of In2X2O7 (X= C, Si, Ge or Sn)

dc.contributor.authorKarazhanov, Smagul
dc.contributor.authorRavindran, Ponniah
dc.contributor.authorGrossner, Ulrike
dc.date.accessioned2017-08-25T09:20:05Z
dc.date.available2017-08-25T09:20:05Z
dc.date.created2011-10-07T11:37:26Z
dc.date.issued2011
dc.identifier.citationThin Solid Films. 2011, 519 (19), 6561-6567.nb_NO
dc.identifier.issn0040-6090
dc.identifier.urihttp://hdl.handle.net/11250/2451852
dc.language.isoengnb_NO
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleFirst-principles study on electronic structure, phase stability, and optical properties of In2X2O7 (X= C, Si, Ge or Sn)nb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber6561-6567nb_NO
dc.source.volume519nb_NO
dc.source.journalThin Solid Filmsnb_NO
dc.source.issue19nb_NO
dc.identifier.doi10.1016/j.tsf.2011.04.221
dc.identifier.cristin843916
dc.relation.projectNorges forskningsråd: 181884nb_NO
cristin.unitcode7492,1,3,0
cristin.unitnameSolenergi
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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