Browsing IFE BRAGE by Author "Zhou, Chunlan"
Now showing items 1-3 of 3
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Passivation Characteristics of New Silicon Oxide
Gong, Lei; Zhou, Chunlan; Zhu, Junjie; Wang, Wenjing (Journal article; Peer reviewed, 2019) -
Passivation Mechanisms of Atomic Layer-deposited AlOx Films and AlOx/SiOx Stack
Gong, Lei; Zhou, Chunlan; Zhu, Junjie; Wang, Wenjing; Fangxu, Ji (Journal article; Peer reviewed, 2019)A new passivation layer of AlOx/SiOx were prepared, in which 80 nm SiOx was prepared by spin-coating perhydropolysilazane (PHPS) and annealed at 450°C. In order to compare the passivation effect of single AlOx layers and ... -
SiOyNx/SiNx stack: a promising surface passivation layer for high-efficiency and potential-induced degradation resistant mc-silicon solar cells
Zhou, Chunlan; Zhu, Junjie; Zhou, Su; Tang, Yehua; Foss, Sean Erik; Haug, Halvard; Nordseth, Ørnulf; Marstein, Erik Stensrud; Wang, Wenjing (Journal article; Peer reviewed, 2017)