Neutron and x-ray Reflectometry Investigations of Amorphous Silicon-based Surface Passivation Layers
dc.contributor.author | Marstein, Erik Stensrud | |
dc.contributor.author | Hasle, Ida Margrete | |
dc.contributor.author | Qviller, Atle Jorstad | |
dc.contributor.author | Haug, Halvard | |
dc.date.accessioned | 2015-03-03T11:45:20Z | |
dc.date.accessioned | 2015-03-04T09:45:12Z | |
dc.date.available | 2015-03-03T11:45:20Z | |
dc.date.available | 2015-03-04T09:45:12Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | Energy Procedia 2014, 55:813-817 | nb_NO |
dc.identifier.issn | 1876-6102 | |
dc.identifier.uri | http://hdl.handle.net/11250/278369 | |
dc.description | - | nb_NO |
dc.language.iso | eng | nb_NO |
dc.rights | Navngivelse-Ikkekommersiell-IngenBearbeidelse 3.0 Norge | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/no/ | * |
dc.title | Neutron and x-ray Reflectometry Investigations of Amorphous Silicon-based Surface Passivation Layers | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.date.updated | 2015-03-03T11:45:20Z | |
dc.source.journal | Energy Procedia | nb_NO |
dc.identifier.doi | 10.1016/j.egypro.2014.08.064 | |
dc.identifier.cristin | 1225388 |